Load Oscillating Smart Meter Attack

Lassetter, C., Cotilla-Sanchez, E., Kim, J.


Proceedings of the IEEE Global Conference on Signal and Information Processing (GlobalSIP), Washington, DC, December 2016, pp. 821-825.


This paper investigates the potential impacts of load oscillating at-tacks in a microgrid to the stability of the main power grid. The adversary is assumed to be able to control switches within compro-mised smart meters and thus is able to dynamically connect or dis-connect the corresponding loads within the microgrid. Using the commercial PSS/e time-domain simulator with the IEEE Reliabil-ity Test System (RTS-96), we demonstrate the impacts of attacks cycling the total load of the microgrid. Cycling attacks with differ-ent load oscillation frequencies and magnitudes are considered. We found that for certain oscillation frequencies, oscillating 30 percent of the total microgrid load can significantly harm the main grid sta-bility.

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